Preliminary Announcement: Research Positions in Secondary Ion Mass Spectrometry at NIST, Gaithersburg, MD USA

              
Description: 

The Surface and Microanalysis Science Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD is anticipating the availability of both a staff research position in Secondary Ion Mass Spectrometry (SIMS) and a post doctoral research position in ion mobility spectrometry and/or SIMS. 

NIST maintains an active research program in the fundamentals, instrumentation and applications of SIMS. Instrumentation available for research includes a Cameca IMS 4F Ion Microscope, an ION TOF IV Time-of-Flight SIMS instrument, a Cameca IMS 1270 High Performance Multicollector Magnetic Sector Mass Spectrometer, a Laser Microprobe Mass Spectrometer (LMMS), quadrupole ion trap time of flight mass spectrometer, ion mobility spectrometers and an isotope ratio mass spectrometer (IRMS). In addition, a full array of microanalysis techniques are available including: Auger, XPS, GIXPS, SEM, FE-SEM, TEM, Environmental SEM, Scan Probe, IR and Raman Microprobes, and near field scanning optical microscopy. Several of the NIST SIMS instruments are fitted with prototype cluster primary ion sources for Cluster SIMS analysis. Active research interests of our research group include (but are not limited to): organic, polymer and biological microanalysis, the use of energetic cluster primary ion beams for surface analysis, depth profiling, quantitative analysis, analysis of semiconductor materials, standards for SIMS, precision isotopic ratio measurements of terrestrial, extraterrestrial and biological materials, secondary ion imaging in 2 and 3 dimensions, fundamentals of elemental and molecular secondary ion emission, instrumental modification and development, ion source design and construction, ion optical computer modeling and computer simulations of the sputtering process. 

The staff research position will involve daily operation and maintenance of a Cameca IMS 4F SIMS instrument to support our existing research programs in semiconductor metrology. Opportunities will also exist to conduct independent SIMS research in any of the areas listed above with a preferred focus on cluster SIMS and biomaterials characterization. The position requires a PhD in Chemistry, Physics or related field. Practical experience with Cameca magnetic sector SIMS instruments is highly desired. We are also seeking potential post doctoral candidates for a two year appointment in a new research program in ion mobility spectrometry/mass spectrometry and trace explosive/narcotics detection for homeland security and forensic applications. 

Applicants must be US Citizens. Salary will be commensurate with experience. 

If you would like to be considered for either of these positions, please send a resume to:
Dr. Greg Gillen, Surface and Microanalysis Science Division
National Institute of Standards and Technology, Mailstop 8371
Gaithersburg, MD 20899
Phone: 301-975-2190, Email: greg.gillen@nist.gov