The 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) will be held in Orlando, FL in September, 1997. The biennial SIMS conference series has become the premier international forum on the most recent developments in secondary ion mass spectrometry. Over 400 attendees are expected for the upcoming meeting. The scientific program will cover all aspects of the technique including: fundamentals, quantification, instrumentation, organic and biological analysis, depth profiling, semiconductor characterization, metals, geology, imaging, TOF SIMS, standards development, isotopic measurements and related techniques. Sessions will provide a forum for reporting new results and sharing practical information about SIMS as well as providing an informal atmosphere to encourage extended discussions. Both oral and poster sessions are planned as well as topical symposia and workshops on a variety of topics. All participants are invited to submit an abstract of work to be presented at the conference. Your abstract should emphasize the originality of the work. The work must be unpublished at the time of the conference. Proceedings for SIMS XI will be published as a hard bound book by John Wiley and Sons.

This meeting is being held under the auspices of the American Society for Mass Spectrometry and is being organized by the organizers of the Annual Workshop on SIMS. The technical program for the 1997 10 th Annual Workshop on SIMS will be incorporated into the program for SIMS XI. An important aim of the organizing committee is to provide an environment that will stimulate the exchange of practical information on SIMS between attendees. For this reason a single resort hotel has been chosen as the site location.

Special symposia will be held on isotopic measurements by SIMS, advanced characterization of semiconductors, practical TOF SIMS and the current status of SIMS instrumentation. Workshops are planned on Standards for SIMS and ultra shallow depth profiling. A special one day workshop on Biological SIMS will be held on Sunday September 7. Additional meeting rooms are available for special topical meetings and workshops. Please let us know if you have a suggestion. Both the ASTM SIMS subcommittee and the ISO TC 201 SIMS subcommittee will also be holding meetings in conjunction with SIMS XI. An extensive vendor program has been planned which will include an exhibit for components and data systems.