Current Location: Home > International Committee
International Committee
Prof. A. Benninghoven (Chairman)
University of Muenster, Germany
Prof. V.T. Cherepin
Ukrainian Academy of Sciences, Ukraine
Charles A. Evans, Jr.
Full Wafer Analysis, USA
Prof. Yoshimasa Nihei
University of Tokyo, Japan
Prof. Georges Slodzian
University of Paris-Sud, France
Prof. H.W. Werner
The Netherlands
Prof. Peter Williams
Arizona State University, USA
