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Detailed programme (PDF)

Programme at a Glance:

Time Sunday Monday Tuesday Wednesday Thursday Friday
08:40  

Opening Address

Parallel Sessions

FUN1 / FUN2

Parallel Sessions

ACG / ORG1 / CLU

Plenary Session

Parallel Sessions

ORG2 / DEP1 / BTC

Parallel Sessions

DIS / SEM

Parallel Sessions

DEP2 / ORG3/ INS

10:40    Refreshments  Refreshments  Refreshments  Refreshments  Refreshments
11:00  

Parallel Sessions

FUN1 / CLU1

Parallel Sessions

ACG / ORG1 / CLU

 Parallel Sessions

ORG2 / DEP1 BTC

Parallel Sessions

DIS / SEM

 Parallel Sessions

DEP2 / BIO2 / MAT

 13:00   Lunch Lunch Lunch Lunch Closing Address
 14:00  

 Plenary Session

Parallel Sessions

QUA / CLU2

Parallel Sessions

ACG / BIO1

Excursion

Parallel Sessions

DIS / NAN

 
 15:40   Refreshments  Refreshments    Refreshments  
16:00  Registration

Parallel Sessions

QUA / CLU2

 Parallel Sessions

ACG / BIO1

 Excursion

Parallel Sessions

DIS / PAR

 
 17:20   Poster Session 1        
 18:00   Poster Session 1 Business Meeting   Poster Session 2  
19:00

Welcome Reception

Weston Building

Buffet & Drinks

Manufacturer's Talks

Buffet & Drinks

Museum of Science and Industry

Conference Dinner

Town Hall

Poster Session 2  
20:00         Manufacturer's User Meetings  

Guide to Code

     

Monday

FUN1 Fundamentals of the SIMS process
  QUA Quantification and standards
  FUN2 Fundamentials of ion emission
  CLU1 Cluster ion beams - part 1
  CLU2 Cluster ion beams - part 2
Tuesday ACG Symposium on Archaeometry, Cosmochemistry and Geology
  ORG1 Advances in the analysis of organics - polymers and molecules - part 1
  BIO1 Bioanalysis - part 1
  CLU3 Cluster ion beams - part 3
Wednesday ORG2 Advances in the analysis of organics - matrix effects in SIMS - part 2
  DEP1 Depth profiling - frontiers in the analysis of semiconductors - part 1
  BTC Bioanalysis - biotechnology
Thursday DIS Discussion on meeting the challenge of molecule specific analyis and imaging in organic and bio-systems
  SEM Depth profiling for emerging semiconductor materials
  NAN Nanotechnology
  PAR Nanoparticles and particle analysis
Friday DEP2 Depth profiling - frontiers in the analysis of semiconductors - part 2
  ORG3 Advances in the analysis of Organics - biological materials - part 3
  BIO2 Bioanalysis - part 2
  INS Instrumentation and technique development
  MAT Analysis of advanced materials

 

 

SIMS XV 15th Annual Secondary Ion Mass Spectrometry Conference
September 12-16th 2005, Manchester, UK


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