The 11th Annual Workshop on SIMS will be held in Austin, Texas in May 1998. The goal of the workshop is to provide an informal forum for the interchange of information about SIMS. Sessions are typically devoted to methods of analysis, instrumentation and fundamentals. Special topic tutorial sessions are held on new and emerging aspects of the technique. This year's Workshop will deal with the practical aspects of secondary ion mass spectrometry. A selection of proposed special topic areas include approaches to the interpretation of real-world time-of-flight mass spectra, artifacts of concern in sputter depth profiles, alternative\complementary analytical techniques to SIMS, ultra-shallow depth profiling, and state-of-the-art instrumental developments and applications. The format of the workshop is informal, with topics of interest to both the novice and experienced SIMS user. Both oral and poster sessions are planned. All participants are invited to submit an abstract of work to be presented at the conference. You are also encouraged to bring a few overhead transparencies illustrating novel applications of SIMS to present in discussions.
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