SIMS Career Opportunity

Preliminary Announcement: Research Positions in Secondary Ion Mass Spectrometry at NIST, Gaithersburg, MD USA


Close Date: Ongoing Recruitment
Contact
Dr. Greg Gillen, Surface and Microanalysis Science Division
National Institute of Standards and Technology, Mailstop 8371
Gaithersburg, MD 20899
Phone: 301-975-2190, Email: greg.gillen@nist.gov

         
Description: 
The Surface and Microanalysis Science Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD is anticipating the availability of NRC post doctoral research positions in ion mobility spectrometry, secondary ion mass spectrometry and atmospheric pressure ionization mass spectrometry.


NIST maintains an active research program in the fundamentals, instrumentation and applications of advanced IMS and mass spectrometry. Instrumentation available for research includes a Cameca IMS 4F Ion Microscope, an ION TOF IV Time-of-Flight SIMS instrument, a Cameca IMS 1280 High Performance Multicollector Magnetic Sector Mass Spectrometer, a Laser Microprobe Mass Spectrometer (LMMS), quadrupole ion trap time of flight mass spectrometer, triple quadrupole atmospheric pressure mass spectrometers, multiple ion mobility spectrometers and an isotope ratio mass spectrometer (IRMS). In addition, a full array of microanalysis techniques are available including: Auger, XPS, GIXPS, SEM, FE-SEM, TEM, Dual Beam FIB, Atom Probe, Environmental SEM, Scan Probe, IR and Raman Microprobes, and near field scanning optical microscopy. Several of the NIST SIMS instruments are fitted with prototype cluster primary ion sources for Cluster SIMS analysis. Active research interests of our research group include (but are not limited to): organic, polymer and biological microanalysis, the use of energetic cluster primary ion beams for surface analysis, depth profiling, quantitative analysis, analysis of semiconductor materials, standards for SIMS, precision isotopic ratio measurements of terrestrial, extraterrestrial and biological materials, secondary ion imaging in 2 and 3 dimensions, fundamentals of elemental and molecular secondary ion emission, instrumental modification and development, ion source design and construction, ion optical computer modeling computer simulations of the sputtering process, nanomaterials analysis and analysis of trace explosives and narcotics.

Applicants must be US Citizens. If you would like to get more information for this position, please send a resume to:

Dr. Greg Gillen, Surface and Microanalysis Science Division
National Institute of Standards and Technology, Mailstop 8371
Gaithersburg, MD 20899
Phone: 301-975-2190, Email: greg.gillen@nist.gov
 

 

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