SIMS Career Opportunity

Post doctoral scholar, University of Texas at Dallas,
Dallas, TX, USA
 

Close Date:  Open until Filled
Contact
:  
Prof. Amy V. Walker, amy.walker@utdallas.edu
 

Description:   

Postdoctoral position available in Surface Chemical Imaging

The object of the proposed work is to extract maximal information from data sets obtained in chemical imaging techniques, including imaging mass spectrometry, infrared and Raman microscopy, scanning Auger
microscopy and x-ray photoelectron spectroscopy (XPS) imaging. The initial focus will be on time-of-flight secondary ion mass spectrometry (TOF SIMS) data. In TOF SIMS imaging a complete high-resolution mass
spectrum is obtained at each pixel, with lateral resolution as fine as 200 nm.  From these data we shall extract the chemical concentration profiles, component spectra, sample topography, and other information, using maximum a posteriori probability analysis and stochastic optimization techniques.

Applicants for this position should have experience with some surface chemical imaging techniques, preferably imaging mass spectrometry, and some familiarity with data analysis, numerical methods and statistics
and probability.  Research activities will be primarily computational - programming and/or high-performance computing experience is therefore desirable, but not absolutely necessary as long as the applicant is able
to learn quickly.

This position is available starting immediately. Further information concerning project and/or employment details will be provided upon request.  To apply, please forward a complete vita and have at least two
letters of recommendation sent to:
Amy V. Walker
Department of Materials Science and Engineering, RL10
University of Texas at Dallas,
800 W. Campbell Road,
Richardson,
TX 75080
Ph: 972 883 5780
Fax: 972 883 5725

 

 


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