Listing of Sites where Secondary Ion Mass
Spectrometry is a primary focus. Commercial sites are included if
they contain useful practical information about SIMS. Full vendor
contact information can be found in the vendor directory. If you
have a site you would like to have included in this list, please
contact us.
Professional Societies
American Vacuum Society Applied Surface Science Division
http://divisions.avs.org/assd/assd.html
SIMS Companies
- RTG
Mikroanalysis GmbH Berlin is a service-oriented enterprise
focusing its main activities on microanalysis by means of
Secondary Ion Mass Spectrometry (SIMS).
- ION-TOF
- Base Peak from
Wiley
A comprehensive www resource for mass
spectrometry. Developed by Wiley and based on Kermit Murrays
mass spectrometry on the internet www site. This is a must
visit site for information on mass spectrometry.
 The
NIST Chemistry Webbook
The NIST Chemistry WebBook, contains:
Thermochemical data for over 4000 organic and small inorganic
compounds, Heat of reaction data for over 1300 reactions ,IR
spectra for over 5000 compounds, Mass spectra for over 8000
compounds and Ion energetics data for over 12000
compounds.
James
F. Zieglers SRIM Page
The home page for the Stopping and Range of
Ions in Matter (SRIM-also known as TRIM). Download the latest
version of this widely used program for free!!
Mass Spectrometry Links:
- Surface Analysis
Tutorials A collection of tutorials on SIMS written by Ron
Flemming formerly of Charles Evans and AssociatesAt present
they are targeted at the college undergraduate to graduate
level, but may appeal to anyone with some physical science
background.
- Surface
Chemistry Coursewritten by Dr. Roger Nix, Department of
Chemistry, Queen Mary & Westfield College, University of
London
A number of SIMS book titles are
available on the internet. The listing below can be found at Barnes
and Noble or Amazon.com
- Secondary
Ion Mass Spectrometry; SIMS XI Proceedings of the 11th
International Conference, Orlando, FL, Published 1998, G.
Gillen,R. Lareau, J. Bennett and F. Stevie (editors)
/Hardcover/
- Secondary
Ion Mass Spectrometry: SIMS X A. Benninghoven (Editor),B.
Hagenhoff (Editor) / Hardcover
- Secondary
Ion Mass Spectrometry : SIMS IX Proceedings of the Ninth
International Conference on Secondary Ion Mass Spectrometry,
A. Benninghoven, et al / Hardcover / Published 1994
- Secondary
Ion Mass Spectrometry : SIMS VIII A. Benninghoven, et al /
Published 1992
- Secondary
Ion Mass Spectrometry SIMS VI Proceedings of the Sixth
International Conference on Secondary Ion Mass
Spectrometry/SIMS VI A. Benninghoven, et al / Published 1988
- Secondary
Ion Mass Spectrometry: SIMS V Proceedings of the Fifth
International Conference, Washington, DC, September 30-October
4, 1985 A. Benninghoven,D. S. Simon (Editor),H. W. Werner
(Editor) / Hardcover /
- Secondary
Ion Mass Spectrometry: SIMS IV Proceedings of the Fourth
International Conference, Osaka, Japan (Springer Series in
Chemical Physics 36) A. Benninghoven, et al / Published 1984
- Secondary
Ion Mass Spectrometry SIMS III A. Benninghoven / Hardcover
/ Published 1982
- Secondary
Ion Mass Spectrometry SIMS II: Proceedings of the
International Conference on Secondary Ion Mass Spectrometry A.
Benninghoven (Editor),R. Shimizu (Editor),R. A. Powell (Editor),C.
A. Evans (Editor),H. A. Storms (Editor) / Hardcover /
- Secondary
Ion Mass Spectrometry : Basic Concepts, Instrumental Aspects,
Applications and Trends (Chemical Analysis, Vol 86) A.
Benninghoven, et al / Hardcover / Published 1987
- Handbook
of Static Secondary Ion Mass Spectrometry David Briggs,A.
Brown,J. C. Vickerman / Hardcover /
- Secondary
Ion Mass Spectrometry: A Practical Handbook for Depth
Profiling Bulk Impurity Analysis Robert G. Wilson,F. A.
Stevie,C. W. Magee / Hardcover /
- Secondary
Ion Mass Spectrometry: Principles and Applications J. C.
Vickerman,A. Alan. Brown,Nicola M. Reed (Editor) / Hardcover/
- Ion
Formation from Organic Solids: IFOS II Proceedings of the
2nd Intl Conference,Munster, Germany, Sept 7-9, 1982 Alfred
Benninghoven (Editor) / Hardcover/ Published 1983
- Ion
Formation from Organic Solids: IFOS III Mass Spectrometry
of Involatile Material (Springer Proceedings in Physics, Vol
9) A. Benninghoven (Editor) / Hardcover / Published 1986
- Ion
Formation from Organic Solids: IFOS IV Mass Spectrometry
of Involatile Material : Proceedings of the Fourth
International Conference, Munster,) A. Benninghoven (Editor) /
Published 1989
-
The following is a list of shareware and
freeware which we believe to be of interest to the SIMS
community. We are particularly interested in instrument
control and data reprocessing software written by SIMS users
that may not be available anywhere else. Other types of
information such as mechnical drawings, ion optical
simulations of SIMS instrumentation and sputtering simulation
programs would also be welcome. If you have material you would
like to include in this archive, please
email us
Software Disclaimer: We make no guarantee about the
suitability or the accuracy of the information or the programs
listed in this archive. We are not responsible for any
problems which running or downloading this software causes. We
are not aware of any virus containing programs, but all
programs downloaded from here or elseware should be examined
carefully for viruses.
Image Processing Applications
- NIH
Image
This is a highly rated Macintosh-based image manipulation
program written by Wayne Rasband at NIH. Numerous related
links on Macintosh image processing can be found here.
- MacLispix
This is another Macintosh-based image processing program
written by Dave Bright at NIST. Dave works closely with
SIMS researchers at NIST and his software can direclty
import CE&A image files
Cameca Ion Microscope Software
- Albert
Fahey's Software Archive A group of resources written
by Albert Fahey from NIST. Includes mechanical drawings
for IMS 4F sample holders, source code to run Charles
Evans and Associates interfaces to the Cameca IMS 3f-4F,
programs for isotopic SIMS data reduction and REE analysis
(and much more).
Sputter/Ion Implantation Simulations
- The Stopping and Range of
Ions in Matter (SRIM-also known as TRIM)SRIM, written
by James F. Zieglers, calculates the energy loss of ions
in solids, liquids and gases. This physics is combined
with kinematic physics to calculate the transport of
energetic ions in matter, including the transport of
recoil atoms after ion/atom collisions. It can be used to
predict energetic ion ranges in matter, ion transmission
and reflection from matter, and the similar distributions
for recoiling target atoms.
This package is a DOS package, and is simple to install in
all DOS based systems.
Ion Optical Modeling
- SIMION
6.0 (demo version)
SIMION is a PC based ion optics simulation program that
models ion optics problems with 2D symmetrical and/or 3D
asymmetrical electrostatic and/or magnetic potential
arrays. The program was written for thePC by David A. Dahl
at the Idaho National Engineering Laboratory. A brief
summary is provided here.
The demo software comes with a complete manual which may
be printed out. The program is marketed by Ion
Source Software.
URL: http://www.gerbig.com/index.html
Title: AireCell Cleanrooms
Description:
Cleanroom design, fabrication installation and cleanroom
certification. We install modular and softwall cleanrooms
and sell cleanroom supplies and accessories.
URL: http://www.chemistryguide.org
Title: Chemistry Guide
Description:
WWW Chemistry Guide - comprehensive and evaluated guide to web
sites
related to chemistry and the chemical industry. Its mission
consists
in collecting and independently annotating all useful chemistry
sites.
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